Focus on the core business of new energy nanomaterials, and provide supporting products and solutions for leading enterprises at home and abroad
Key words:
Classification:
Product Details
An instrument that uses an electron beam with a very short wavelength as an electron light source, irradiates a very thin sample with a high-speed, concentrated electron beam, and collects transmitted electrons to pass through an electromagnetic lens for multi-stage magnification and imaging. It is used to observe the microstructure of materials, such as diffraction of single crystal and polycrystalline; The electron beam passing through the sample carries the structural information inside the sample. After focusing and primary magnification of the objective lens, it enters the lower lens for comprehensive magnification imaging. Through the high-resolution imaging technology of electron microscope, the information about the lattice structure of the substrate and the film and the information about the interface structure can be obtained through the selected area diffraction pattern (SAED).
Previous
None
Next
Contact Us
Company Address: 12th Floor, Chuangfu Center, Building 5, Century Jinyuan Shopping Center, 188 Pandun Road, Chengmen Town, Cangshan District, Fuzhou City, Fujian Province
Factory address: No. 666, Nancao Village, Jiangyin Town, Fuqing City, Fujian Province
Telephone:+86-13615001818
E-mail:bob@fuxuantech.cn
Focus on us
All rights reserved©Fujian Fuxuan Technology Co., Ltd. |SEO | Business License